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Journal papers published in 2026

  • B. -H. Kim, S. -H. Kuk, H. -S. Hwang, J. Jeong, Y. Park, Y. -J. Suh, J. -P. Kim, C. -J. Lee, S. -K. Kim, D. -M. Geum, B. -J. Cho, S. -H. Kim*, "Asymmetric Memory Window Recovery Behavior in n/p-FeFETs Revealed by Trap Analysis", IEEE Transactions on Device and Materials Reliability, accepted

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